Novel Trigger Circuit & SCR Device Co-Engineering Based Local (I/O-VSS & I/O-VDD) ESD Clamp Concepts with Improved Latch-Up Susceptibility, Lower Leakage and Lower Capacitance for Ultra High Speed I/Os. - Mitesh Goyal; Mukesh Chaturvedi; Harihar Nath; Mahesh Vaidya; Mayank Shrivastava (IRPS, 2025)