Reliability Stressing Control Using Jacobian Feedback Kelvin Measurement on Intel Technologies. - Peng Xiao; Haris Hadziosmanovic; Rong Jiang; Misagh Rostami-asrabad; Stephen Ramey; Ilan Tsamaret (IRPS, 2020)

Customized Parallel Reliability Testing Platform with Multifold Throughput Enhancement for Intel Stressing Tests. - Peng Xiao; Haris Hadziosmanovic; Michael Klessens; Rong Jiang; John Ortega 002; Daniel Schroeder; James Palmer 002; Ilan Tsameret (IRPS, 2021)