Methodology for accurate extrapolation of InGaP/GaAs HBT safe operating area (SOA) for variations in emitter area and ballast resistor size. - Robert S. Howell; Randall Lewis; H. George Henry; Harold Hearne; Deas Brown; Dale Dawson; Andris Ezis (Microelectron. Reliab., 2014)

Design and process related MIM cap reliability improvement. - Justin Parke; Randy Lewis; Kathy Ha; Harlan Cramer; Harold Hearne (Microelectron. Reliab., 2015)

Demonstration of superconducting memory for an RQL CPU. - Randall Burnett; Ryan Clarke; Timothy Lee; Harold Hearne; Jacob Vogel; Quentin Herr; Anna Herr (MEMSYS, 2018)