Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver. - Arya Moradinia; Rafael Perez Martinez; Jeffrey W. Teng; Nelson Sepúlveda-Ramos; Harrison Lee 002; John D. Cressler (BCICTS, 2020)

Performance vs. Reliability Tradeoffs of Medium Breakdown and High Performance Cascode Amplifier Cells. - Harrison Lee 002; Arya Moradinia; Jeffrey W. Teng; Nelson Sepúlveda-Ramos; John D. Cressler (BCICTS, 2022)

Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers. - Nelson Sepúlveda-Ramos; Jeffrey W. Teng; Harrison Lee 002; John D. Cressler (BCICTS, 2022)