Reliability Differences Between SiGe HBTs Optimized for High-Performance and Medium-Breakdown. - Rafael Perez Martinez; Uppili S. Raghunathan; Brian R. Wier; Harrison P. Lee; John D. Cressler (BCICTS, 2019)

Physics of Hot Carrier Degradation Under Saturation Mode Operation in SiGe HBTs. - Uppili S. Raghunathan; Pui Yee; Dave Brochu; Vibhor Jain; Harrison P. Lee; John D. Cressler; Dimitris P. Ioannou (BCICTS, 2020)

Dynamic Behavior of Breakdown Mechanisms in SiGe HBTs. - Harrison P. Lee; Jeffrey W. Teng; Nelson Sepúlveda-Ramos; John D. Cressler (BCICTS, 2021)

The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs. - Harrison P. Lee; Nelson Sepúlveda-Ramos; Jeffrey W. Teng; Jackson P. Moody; Delgermaa Nergui; Brett L. Ringel; Zachary R. Brumbach; Alizeh Premani; Uppili S. Raghunathan; Vibhor Jain; John D. Cressler (BCICTS, 2023)

TCAD-Based Design of SiGe HBT Germanium Profiles via Bayesian Optimization. - Justin P. Heimerl; Jeffrey W. Teng; Harrison P. Lee; Delgermaa Nergui; Jackson P. Moody; John D. Cressler (BCICTS, 2024)

Using Pulsed-Mode Measurements of SiGe HBTs for Non-Destructive, Improved RF-SOA Estimation. - Nelson Sepúlveda-Ramos; Harrison P. Lee; Jeffrey W. Teng; John D. Cressler (BCICTS, 2024)

Anomalous Mixed-Mode Damage Effects in SiGe HBTs at Cryogenic Temperatures. - Harrison P. Lee; Delgermaa Nergui; Jeffrey W. Teng; Jackson P. Moody; Nelson Sepúlveda-Ramos; John D. Cressler (IRPS, 2024)

The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and Ionizing Radiation for 130-nm and 90-nm SiGe HBTs. - Delgermaa Nergui; Mozhgan Hosseinzadeh; Y. A. Mensah; Harrison P. Lee; D. G. Sam; K. Li; E. X. Zhang; Daniel M. Fleetwood; John D. Cressler (IRPS, 2024)