Testability Properties of Local Circuit Transformations with Respect to the Robust Path-Delay-Fault Model. - Harry Hengster; Rolf Drechsler; Bernd Becker 001 (VLSI Design, 1994)

On the application of local circuit transformations with special emphasis on path delay fault testability. - Harry Hengster; Rolf Drechsler; Bernd Becker 001 (VTS, 1995)

On local transformations and path delay fault testability. - Harry Hengster; Rolf Drechsler; Bernd Becker 001 (J. Electron. Test., 1995)

AND/EXOR based Synthesis of Testable KFDD-Circuits with Small Depth. - Harry Hengster; Rolf Drechsler; Bernd Becker 001; Stefan Eckrich; Tonja Pfeiffer (Asian Test Symposium, 1996)

Local Transformations and Robust Dependent Path Delay. - Harry Hengster; Uwe Sparmann; Bernd Becker 001; Sudhakar M. Reddy (ITC, 1996)

A scalable BIST architecture for delay faults. - Martin Keim; Ilia Polian; Harry Hengster; Bernd Becker 001 (ETW, 1999)

Synthesis of Circuits Derived from Decision Diagrams - Combining Small Delay and Testability. - Harry Hengster; Bernd Becker 001 (FTCS, 1999)

Testability of 2-Level AND/EXOR Circuits. - Rolf Drechsler; Harry Hengster; Horst Schäfer; Joachim Hartmann; Bernd Becker 001 (J. Electron. Test., 1999)

EXOR-basierte Logiksynthese mit Kronecker Functional Decision Diagrams. - Harry Hengster (2001)

Software-Lizenzierung für Engineering-Tools. - Harry Hengster (Aspekte der Technischen Informatik, 2014)