Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. - Nagothu Karmel Kranthi; Abhishek Mishra; Adil Meersha; Harsha B. Variar; Mayank Shrivastava (IRPS, 2018)

First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects. - Abhishek Mishra; Adil Meersha; Nagothu Karmel Kranthi; Kruti Trivedi; Harsha B. Variar; N. S. Veenadhari Bellamkonda; Srinivasan Raghavan 002; Mayank Shrivastava (IRPS, 2019)

3D Approaches to Engineer Holding Voltage of SCR. - Satendra Kumar Gautam; Harsha B. Variar; Juan Luo; Ning Shi; David Marreiro; Shekar Mallikarjunaswamy; Mayank Shrivastava (IRPS, 2023)

Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices. - Jeevesh Kumar; Hemanjaneyulu Kuruva; Harsha B. Variar; Utpreksh Patbhaje; Mayank Shrivastava (IRPS, 2023)

Circuit Reliability of $ text{MoS}_{2}$ Channel Based 2D Transistors. - Anand Kumar Rai; Harsha B. Variar; Mayank Shrivastava (IRPS, 2023)

Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept. - Harsha B. Variar; Satendra Kumar Gautam; Ashita Kumar; K. M. Amogh; Juan Luo; Ning Shi; David Marreiro; Shekar Mallikarjunaswamy; Mayank Shrivastava (IRPS, 2023)