Transitioning eMRAM from Pilot Project to Volume Production. - Cyrille Dray; Khushal Gelda; Benoit Nadeau-Dostie; Wei Zou; Luc Romain; Jongsin Yun; Harshitha Kodali; Lori Schramm; Martin Keim (ITC, 2023)

A Novel BIST Method for Multi-Port Register Files. - Andy Chen; Vianney Choserot; Munish Kumar; Khushal Gelda; Shreyas Pramod Dixit; Wei Zou; Jongsin Yun; Harshitha Kodali; Albert Au; Lori Schramm; Martin Keim (ETS, 2025)

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. - Vinayak Bharat Naik; Gregory Billus; Amit Kumar Shukla; Andre Vogel; Veit Kriegerstein; Patrick Scharf; Venkata Siva Komma; Johannes Mueller; Thomas Merbeth; Ralf Flemming; Ingolf Lorenz; Muthu Kumaran Nambi; et al. (ETS, 2025)