On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test. - Yousuke Miyake; Takaaki Kato; Seiji Kajihara; Masao Aso; Haruji Futami; Satoshi Matsunaga; Yukiya Miura (IOLTS, 2020)

Innovative Test Practices in Asia. - Takeshi Iwasaki; Masao Aso; Haruji Futami; Satoshi Matsunaga; Yousuke Miyake; Takaaki Kato; Seiji Kajihara; Yukiya Miura; Smith Lai; Gavin Hung; Harry H. Chen; Haruo Kobayashi 001; et al. (VTS, 2020)