Automatic layout algorithms for function blocks of CMOS gate arrays. - Shigeo Noda; Hitoshi Yoshizawa; Etsuko Fukuda; Haruo Kato; Hiroshi Kawanishi; Takashi Fujii (DAC, 1985)

Color reproduction test for CCD image sensors. - Haruo Kato (ITC, 1990)

CCD Image Sensor Test Using Cellular Automation-Type Pattern Recognition System. - Haruo Kato (ITC, 1992)