Electron inelastic mean free path for B4C and BC2N determined by reflection electron energy loss spectroscopy. - Harvi Alirio Castillo; Alfonso Devia; Gerardo Soto; Jesús A. Díaz; Wencel De La Cruz (Microelectron. J., 2008)

Chemical and morphological properties of (Ti-Zr)N thin films grown in an arc pulsed system. - O. A. Trujillo; Harvi Alirio Castillo; L. C. Agudelo; Alfonso Devia (Microelectron. J., 2008)