Use of ensemble methods for indirect test of RF circuits: can it bring benefits? - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (LATS, 2019)

Which metrics to use for RF indirect test strategy? - Hassan El Badawi; Mariane Comte; Florence Azaïs; Vincent Kerzèrho; Serge Bernard; François Lefevre (SMACD, 2019)

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. - Florence Azaïs; Serge Bernard; Mariane Comte; Bastien Deveautour; Sophie Dupuis; Hassan El Badawi; Marie-Lise Flottes; Patrick Girard 001; Vincent Kerzèrho; Laurent Latorre; François Lefèvre; Bruno Rouzeyre; et al. (IOLTS, 2020)

Implementing indirect test of RF circuits without compromising test quality: a practical case study. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzèrho; Francois Lefevre; I. Gorenflot (LATS, 2020)

Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (J. Electron. Test., 2020)

Methodologie pour une mise en oeuvre efficace du test indirect pour circuits intégrés analogique/RF. (Methodology for efficient Implementation of Indirect testing for analog/RF integrated circuits). - Hassan El Badawi (2020)

Exploring on-line RF performance monitoring based on the indirect test strategy. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzèrho; François Lefèvre (LATS, 2021)

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (J. Electron. Test., 2021)

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (J. Electron. Test., 2023)