A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples. - He Zhao 013; Jinhai Liu; Jianhua Tang; Xiangkai Shen; Senxiang Lu; Qiannan Wang (IEEE Trans. Instrum. Meas., 2023)

SSCT-Net: A Semisupervised Circular Teacher Network for Defect Detection With Limited Labeled Multiview MFL Samples. - Xiangkai Shen; Jinhai Liu; Jiayue Sun; Lin Jiang 003; He Zhao 013; Huaguang Zhang (IEEE Trans. Ind. Informatics, 2023)

A Dynamic Weights-Based Wavelet Attention Neural Network for Defect Detection. - Jinhai Liu; He Zhao 013; Zhaolin Chen; Qiannan Wang; Xiangkai Shen; Huaguang Zhang (IEEE Trans. Neural Networks Learn. Syst., 2024)

An Industrial Fault Sample Reconstruction and Generation Method Under Limited Samples With Missing Information. - Yifu Ren; Jinhai Liu; He Zhao 013; Huaguang Zhang (IEEE Trans. Syst. Man Cybern. Syst., 2024)

A Novel Incremental Defect Detection Method via Elastic Heterogeneous Distillation Network. - Xiangkai Shen; Jinhai Liu; Huaguang Zhang; Lin Jiang 003; He Zhao 013; Hongyu Yang (IEEE Trans Autom. Sci. Eng., 2025)

A Masked Multi-View Bidirectional Network for Class Extremely Imbalanced Object Detection Under Magnetic Flux Leakage Signals. - He Zhao 013; Jinhai Liu; Huaguang Zhang; Qiannan Wang; Xiangkai Shen; Xin Zhang (IEEE Trans Autom. Sci. Eng., 2025)

TSDD-UB: A Texture Simplification-Based Denoising Diffusion Model for Unsupervised Defect Detection Under Ultrasonic B-Scan Signal. - Liwei Wang; Jinhai Liu; Yuan Zhong; Xiangkai Shen; He Zhao 013 (IEEE Trans. Instrum. Meas., 2025)