A substrate noise analysis methodology for large-scale mixed-signal ICs. - Wen Kung Chu; Nishath K. Verghese; Heayn-Jun Chol; Kenji Shimazaki; Hiroyuki Tsujikawa; Shouzou Hirano; Shirou Doushoh; Makoto Nagata; Atsushi Iwata; Takafumi Ohmoto (CICC, 2003)