Defect Analysis and Fault Modeling in MOS Technology. - R. Chandramouli; Hector R. Sucar (ITC, 1985)

High performance test generation for accurate defect models in CMOS gate array technology. - Hector R. Sucar; Susheel J. Chandra; David J. Wharton (ICCAD, 1989)

Use of CrossCheck test technology in practical applications. - Susheel J. Chandra; Tushar Gheewala; Hector R. Sucar; George Swan (VTS, 1991)

Microprocessor Testing: Which Technique is Best? (Panel). - Jacob A. Abraham; Sandip Kundu; Janak H. Patel; Manuel A. d'Abreu; Bulent I. Dervisoglu; Marc E. Levitt; Hector R. Sucar; Ron G. Walther (DAC, 1994)