Off-State TDDB Degradation of RC-Features and Threshold Voltage on Advanced FinFETs from RF Measurements for 5G Applications. - Alan Y. Otero-Carrascal; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Gonzalez; P. Srinivasan 002; Héctor Uribe (IRPS, 2025)