Reliability Analysis by Charge Migration of 3D SONOS Flash Memory. - Jun-Kyo Jeong; Jae-Young Sung; Hee-Hun Yang; Hi-Deok Lee; Ga-Won Lee 001 (IRPS, 2020)

Physical Unclonable Function Using Programmable Delay Lines. - Jiho Park 003; Hee-Hun Yang; Donghun Lee; Hoyoung Yoo (ICEIC, 2024)