Optimal Design of Checksum-Based Checkers for Fault Detection in Linear Analog Circuits. - Heebyung Yoon; Abhijit Chatterjee; Joseph L. A. Hughes (VLSI Design, 1997)

Fault detection and automated fault diagnosis for embedded integrated electrical passives. - Heebyung Yoon; Junwei Hou; Abhijit Chatterjee; Madhavan Swaminathan (ICCD, 1998)

Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. - Heebyung Yoon; Pramodchandran N. Variyam; Abhijit Chatterjee; Naveena Nagi (VTS, 1998)

Signature analysis for analog and mixed-signal circuit test response compaction. - Naveena Nagi; Abhijit Chatterjee; Heebyung Yoon; Jacob A. Abraham (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998)

Fault Detection and Automated Fault Diagnosis for Embedded Integrated Electrical Passives. - Heebyung Yoon; Junwei Hou; Swapan K. Bhattacharya; Abhijit Chatterjee; Madhavan Swaminathan (J. VLSI Signal Process., 1999)

Specialized Product-Line Development Methodology for Developing the Embedded System. - Ki-Sam Hong; Heebyung Yoon (Int. J. Fuzzy Log. Intell. Syst., 2005)

Fault Management of Robot Software Components Based on OPRoS. - JongYoung Kim; Heebyung Yoon; SungHoon Kim 001; Sang Hyuk Son (ISORC, 2011)