Novel charge neutralization techniques applicable to wide current range of FIB processing in FIB-SEM combined system. - Hirotaka Komoda; Masaaki Yoshida; Yoh Yamamoto; Kouji Iwasaki; Ikuko Nakatani; Heiji Watanabe; Kiyoshi Yasutake (Microelectron. Reliab., 2006)

Sample tilting technique for preventing electrostatic discharge during high-current FIB gas-assisted etching with XeF2. - Hirotaka Komoda; Chie Moritani; Kazutaka Takahashi 002; Heiji Watanabe; Kiyoshi Yasutake (Microelectron. Reliab., 2007)

Toward the Super Temporal Resolution Image Sensor with a Germanium Photodiode for Visible Light. - Nguyen Hoai Ngo; Anh Quang Nguyen; Fabian M. Bufler; Yoshinari Kamakura; Hideki Mutoh; Takayoshi Shimura; Takuji Hosoi; Heiji Watanabe; Philippe Matagne; Kazuhiro Shimonomura; Kohsei Takehara; Edoardo Charbon; et al. (Sensors, 2020)

A Pixel Design of a Branching Ultra-Highspeed Image Sensor. - Nguyen Hoai Ngo; Kazuhiro Shimonomura; Taeko Ando; Takayoshi Shimura; Heiji Watanabe; Kohsei Takehara; Anh Quang Nguyen; Edoardo Charbon; Takeharu Goji Etoh (Sensors, 2021)

Investigation of reliability of NO nitrided SiC(1100) MOS devices. - Takato Nakanuma; Asato Suzuki; Yu Iwakata; Takuma Kobayashi; Mitsuru Sometani; Mitsuo Okamoto; Takuji Hosoi; Takayoshi Shimura; Heiji Watanabe (IRPS, 2022)

Characterization of Electron Traps in Gate Oxide of m-plane SiC MOS Capacitors. - Yutaka Terao; Takuji Hosoi; Takuma Kobayashi; Takayoshi Shimura; Heiji Watanabe (IRPS, 2022)