Automating test program generation in STIL - expectations and experiences using IEEE 1450 [standard test interface language]. - Helmut Lang; Bhuwnesh Pande; Heiko Ahrens (ETW, 2003)

Bridging the gap between Design and Test Engineering for Functional Pattern Development. - Ernst Aderholz; Heiko Ahrens; Michael Rohleder (ITC, 2008)

DFT Architecture for Automotive Microprocessors using On-Chip Scan Compression supporting Dual Vendor ATPG. - Heiko Ahrens; Rolf Schlagenhaft; Helmut Lang; V. Srinivasan; Enrico Bruzzano (ITC, 2008)

A Scalable Design Flow for Performance Monitors Using Functional Path Ring Oscillators. - Tobias Kilian; Heiko Ahrens; Daniel Tille; Martin Huch; Ulf Schlichtmann (ITC, 2021)