IEEE P1581 - Getting More Board Test Out of Boundary Scan. - Heiko Ehrenberg (ITC, 2006)

Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. - Bambang Suparjo; Adam W. Ley; Adam Cron; Heiko Ehrenberg (ITC, 2006)

IEEE P1581 can solve your board level memory cluster test problems. - Heiko Ehrenberg (ITC, 2007)

IEEE P1581 drastically simplifies connectivity test for memory devices. - Heiko Ehrenberg (ITC, 2008)

Test Mode Entry and Exit Methods for IEEE P1581 compliant devices. - Heiko Ehrenberg (ITC, 2009)

IEEE Std 1581 - A standardized test access methodology for memory devices. - Heiko Ehrenberg; Bob Russell (ITC, 2011)

Refreshing the JTAG Family. - Michele Portolan; Martin Keim; Jeff Rearick; Heiko Ehrenberg (VTS, 2023)