Reliability of 70 nm metamorphic HEMTs. - Maximilian Dammann; Arnulf Leuther; Rüdiger Quay; M. Meng; Helmer Konstanzer; W. Jantz; Michael Mikulla (Microelectron. Reliab., 2004)

Degradation of 0.25 μm GaN HEMTs under high temperature stress test. - Maximilian Dammann; Martina Baeumler; Peter Brückner; Wolfgang Bronner; Stephan Maroldt; Helmer Konstanzer; Matthias Wespel; Rüdiger Quay; Michael Mikulla; Andreas Graff; M. Lorenzini; M. Fagerlind; et al. (Microelectron. Reliab., 2015)

Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. - Maximilian Dammann; Martina Baeumler; Vladimir Polyakov; Peter Brückner; Helmer Konstanzer; Rüdiger Quay; Michael Mikulla; Andreas Graff; Michél Simon-Najasek (Microelectron. Reliab., 2017)

Influence of air pollutants on the lifetime of LEDs and analysis of degradation effects. - Andreas Zibold; Maximilian Dammann; Ralf Schmidt; Helmer Konstanzer; Michael Kunzer (Microelectron. Reliab., 2017)

Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology. - Maximilian Dammann; Martina Baeumler; Peter Brückner; Tobias Kemmer; Helmer Konstanzer; Andreas Graff; Michél Simon-Najasek; Rüdiger Quay (Microelectron. Reliab., 2018)

Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress. - Tobias Kemmer; Michael Dammann; Martina Baeumler; Vladimir Polyakov; Peter Brückner; Helmer Konstanzer; Rüdiger Quay; Oliver Ambacher (IRPS, 2020)

Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress. - Maximilian Dammann; Martina Baeumler; Tobias Kemmer; Helmer Konstanzer; Peter Brückner; Sebastian Krause; Andreas Graff; Michél Simon-Najasek (IRPS, 2021)