GaAs Industry in Europe - Technologies, Trends and New Developments. - Helmut Jung; Hervé Blanck; Wolfgang Bösch; Jim Mayock (IEICE Trans. Electron., 2008)

Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification. - Benoit Lambert; Jim Thorpe; Reza Behtash; Bernd Schauwecker; Franck Bourgeois; Helmut Jung; Joëlle Bataille; Patrick Mezenge; Cyril Gourdon; Catherine Ollivier; Didier Floriot; Hervé Blanck (Microelectron. Reliab., 2012)

Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence. - Tommaso Brazzini; Michael A. Casbon; Huarui Sun; Michael J. Uren; Jonathan Lees; Paul J. Tasker; Helmut Jung; Hervé Blanck; Martin Kuball (Microelectron. Reliab., 2015)

Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. - Mikael Broas; Andreas Graff; Michél Simon-Najasek; David Poppitz; Frank Altmann; Helmut Jung; Hervé Blanck (Microelectron. Reliab., 2016)

High resolution physical analysis of ohmic contact formation at GaN-HEMT devices. - Andreas Graff; Michél Simon-Najasek; Frank Altmann; Ján Kuzmík; Dagmar Gregusová; S. Hascik; Helmut Jung; T. Baur; Jan Grünenpütt; Hervé Blanck (Microelectron. Reliab., 2017)