Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. - Helmut Puchner; Y.-C. Liu; W. Kong; F. Duan; R. Castagnetti (Microelectron. Reliab., 2001)

Leakage Increase of Narrow and Short BCPMOS. - Y. Z. Xu; O. Pohland; C. Cai; Helmut Puchner (ISQED, 2004)

NBTI product level reliability for a low-power SRAM technology. - Helmut Puchner (Microelectron. Reliab., 2007)

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems. - Lucas Matana Luza; Daniel Söderström; Georgios Tsiligiannis; Helmut Puchner; Carlo Cazzaniga; Ernesto Sánchez 001; Alberto Bosio; Luigi Dilillo (DFT, 2020)

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM. - Lucas Matana Luza; Daniel Söderström; Helmut Puchner; Rubén García Alía; Manon Letiche; Alberto Bosio; Luigi Dilillo (DTIS, 2020)

Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs. - Mohammadreza Rezaei; Francisco J. Franco; Juan Carlos Fabero; Hortensia Mecha; Helmut Puchner; Juan Antonio Clemente (LATS, 2021)

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. - Carlos J. González; Bruno L. Costa; Diego N. Machado; Rafael Galhardo Vaz; Alexis C. Vilas Bôas; Odair Lelis Gonçalez; Helmut Puchner; Fernanda Lima Kastensmidt; Nilberto H. Medina; Marcilei Aparecida Guazzelli; Tiago Roberto Balen (J. Electron. Test., 2021)

Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories. - Golnaz Korkian; Daniel León; Francisco J. Franco; Juan Carlos Fabero; Manon Letiche; Yolanda Morilla; Pedro Martín-Holgado; Helmut Puchner; Hortensia Mecha; Juan Antonio Clemente (IEEE Access, 2022)