Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS. - Loukas Chevas; Aristeidis Nikolaou; Matthias Bucher; Nikolaos Makris; Alexia Papadopoulou; Apostolos Zografos; Giulio Borghello; Henri D. Koch; Federico Faccio (MIXDES, 2018)

Extending a 65nm CMOS process design kit for high total ionizing dose effects. - Aristeidis Nikolaou; Matthias Bucher; Nikos Makris; Alexia Papadopoulou; Loukas Chevas; Giulio Borghello; Henri D. Koch; Kostas Kloukinas; Tuomas S. Poikela; Federico Faccio (MOCAST, 2018)