On the Challenges of Open-Block Reads in 3D NAND. - Albert B. Chen; Dong-Il Moon; Zhenni Wan; Jiahui Yuan; Henry Chin; Changyuan Chen (IMW, 2025)

Low Cost 'On Pitch Select Gate' (OPS) Technology for 3D Flash Memory. - Abhijith Prakash; Xiang Yang; James Kai; Xiaochen Zhu; Henry Chin; Guirong Liang; Deepanshu Dutta; Masaaki Higashitani; Kazuki Isozumi; Shinsuke Yada; Sayako Nagamine; Kenichi Okabe; et al. (IMW, 2025)