Nuclear physics of cosmic ray interaction with semiconductor materials: Particle-induced soft errors from a physicist's perspective. - Henry H. K. Tang (IBM J. Res. Dev., 1996)

Alpha-particle-induced upsets in advanced CMOS circuits and technology. - David F. Heidel; Kenneth P. Rodbell; Ethan H. Cannon; Cyril Cabral Jr.; Michael S. Gordon; Phil Oldiges; Henry H. K. Tang (IBM J. Res. Dev., 2008)

SEMM-2: A new generation of single-event-effect modeling tools. - Henry H. K. Tang (IBM J. Res. Dev., 2008)

New simulation methodology for effects of radiation in semiconductor chip structures. - Henry H. K. Tang; Conal E. Murray; Giovanni Fiorenza; Kenneth P. Rodbell; Michael S. Gordon; David F. Heidel (IBM J. Res. Dev., 2008)

SOI FinFET soft error upset susceptibility and analysis. - Phil Oldiges; Kenneth P. Rodbell; Michael S. Gordon; John G. Massey; Kevin Stawiasz; Conal E. Murray; Henry H. K. Tang; K. Kim; K. Paul Muller (IRPS, 2015)