Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties. - Olof Engström; Henryk M. Przewlocki; Ivona Z. Mitrovic; Stephen Hall (ESSDERC, 2014)

Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor (GIS) Test Structures. - Krzysztof Piskorski; Henryk M. Przewlocki; Vikram Passi; Jasper Ruhkopf; Max Christian Lemme (MIXDES, 2018)