Re-Using DFT Logic for Functional and Silicon Debugging Test. - Xinli Gu; Weili Wang; Kevin Li; Heon C. Kim; Sung Soo Chung (ITC, 2002)

At-Speed Interconnect Test and Diagnosis of External Memories on a System. - Heon C. Kim; Hong Shin Jun; Xinli Gu; Sung Soo Chung (ITC, 2004)