Optimum Accelerated Degradation Tests for the Gamma Degradation Process Case under the Constraint of Total Cost. - Heonsang Lim (Entropy, 2015)

Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations. - Jiyoung Yoon; Bumgi Lee; Jaehee Song; Bokyoung Kang; Sangho Lee; Doh-Soon Kwak; Heonsang Lim; Ilsang Park; Jonghoon Kim; Sangwoo Pae (IRPS, 2023)