Limitations to photon-emission microscopy when applied to "hot" devices. - Hervé Deslandes; Ted R. Lundquist (Microelectron. Reliab., 2003)

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. - Rudolf Schlangen; Hervé Deslandes; Ted R. Lundquist; C. Schmidt; Frank Altmann; K. Yu; A. Andreasyan; S. Li (Microelectron. Reliab., 2010)

Time-integrated photon emission as a function of temperature in 32 nm CMOS. - Andrea Bahgat Shehata; Alan J. Weger; Franco Stellari; Peilin Song; Hervé Deslandes; Ted R. Lundquist; Euan Ramsay (IRPS, 2015)