Inserting Scan at the Behavioral Level. - Chouki Aktouf; Hérvé Fleury; Chantal Robach (IEEE Des. Test Comput., 2000)

Enhanced Reduced Pin-Count Test for Full-Scan Design. - Harald P. E. Vranken; Tom Waayers; Hérvé Fleury; David Lelouvier (J. Electron. Test., 2002)

Electronic circuit comprising a secret sub-module. - Hérvé Fleury (ITC, 2004)

High throughput non-contact SiP testing. - Brian Moore 001; Chris Sellathamby; Philippe Cauvet; Hérvé Fleury; M. Paulson; Md. Mahbub Reja; Lin Fu; Brenda Bai; Edwin Walter Reid; Igor M. Filanovsky; Steven Slupsky (ITC, 2007)