Reliability study of Power RF LDMOS for Radar Application. - Hichame Maanane; Pierre Bertram; Jérôme Marcon; Mohamed Masmoudi; Mohamed Ali Belaïd; Karine Mourgues; Philippe Eudeline; K. Ketata (Microelectron. Reliab., 2004)

Comparative analysis of accelerated ageing effects on power RF LDMOS reliability. - Mohamed Ali Belaïd; K. Ketata; Karine Mourgues; Hichame Maanane; Mohamed Masmoudi; Jérôme Marcon (Microelectron. Reliab., 2005)

Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance. - M. Gares; Hichame Maanane; Mohamed Ali Belaïd; Mohamed Masmoudi; Jérôme Marcon; Karine Mourgues; Pierre Bertram; Philippe Eudeline (CCECE, 2006)

Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests. - Mohamed Ali Belaïd; K. Ketata; Mohamed Masmoudi; M. Gares; Hichame Maanane; Jérôme Marcon (Microelectron. Reliab., 2006)

Hot carrier reliability of RF N- LDMOS for S Band radar application. - M. Gares; Hichame Maanane; Mohamed Masmoudi; Pierre Bertram; Jérôme Marcon; Mohamed Ali Belaïd; Karine Mourgues; C. Tolant; Philippe Eudeline (Microelectron. Reliab., 2006)

Study of RF N- LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF. - Hichame Maanane; Mohamed Masmoudi; Jérôme Marcon; Mohamed Ali Belaïd; Karine Mourgues; C. Tolant; K. Ketata; Philippe Eudeline (Microelectron. Reliab., 2006)

Study of hot-carrier effects on power RF LDMOS device reliability. - M. Gares; Mohamed Ali Belaïd; Hichame Maanane; Mohamed Masmoudi; Jérôme Marcon; Karine Mourgues; Philippe Eudeline (Microelectron. Reliab., 2007)

A 5000 h RF life test on 330 W RF-LDMOS transistors for radars applications. - Olivier Latry; Pascal Dherbécourt; Karine Mourgues; Hichame Maanane; Jean Pierre Sipma; F. Cornu; Philippe Eudeline; Mohamed Masmoudi (Microelectron. Reliab., 2010)

Characterization and modeling of hot carrier injection in LDMOS for L-band radar application. - Loïc Lachèze; Olivier Latry; Pascal Dherbécourt; Karine Mourgues; V. Purohit; Hichame Maanane; Jean Pierre Sipma; F. Cornu; Philippe Eudeline (Microelectron. Reliab., 2011)

Physical analysis of Schottky contact on power AlGaN/GaN HEMT after pulsed-RF life test. - Jean-Baptiste Fonder; Laetitia Chevalier; Cédric Genevois; Olivier Latry; Cedric Duperrier; Farid Temcamani; Hichame Maanane (Microelectron. Reliab., 2012)

Compared deep class-AB and class-B ageing on AlGaN/GaN HEMT in S-Band pulsed-RF operating life. - Jean-Baptiste Fonder; Olivier Latry; Cedric Duperrier; M. Stanislawiak; Hichame Maanane; Philippe Eudeline; Farid Temcamani (Microelectron. Reliab., 2012)

A workbench development for L-band LDMOS amplifier reliability study (electronic power transistors reliabilty for radar applications). - Pascal Dherbécourt; Olivier Latry; Eric Joubert; Karine Dehais-Mourgues; Hichame Maanane; Jean Pierre Sipma; Philippe Eudeline (ICMCS, 2014)

Implementation and Experimental Validation of Robust Numerical Control for DC-DC Buck Converter. - Abdivall Maouloud; Moussa Boukhnifer; Chérif Larouci; Hichame Maanane; Fabien Simon (CoDIT, 2019)