Buried nanomagnet realizing high-speed/low-variability silicon spin qubits: implementable in error-correctable large-scale quantum computers. - Shota Iizuka; Kimihiko Kato; Atsushi Yagishita; Hidehiro Asai; Tetsuya Ueda; Hiroshi Oka; Junichi Hattori; Tsutomu Ikegami; Koichi Fukuda; Takahiro Mori (VLSI Circuits, 2021)

Effect of Conduction Band Edge States on Coulomb-Limiting Electron Mobility in Cryogenic MOSFET Operation. - Hiroshi Oka; Takumi Inaba; Shota Iizuka; Hidehiro Asai; Kimihiko Kato; Takahiro Mori (VLSI Technology and Circuits, 2022)

Determining the low-frequency noise source in cryogenic operation of short-channel bulk MOSFETs. - Takumi Inaba; Hiroshi Oka; Hidehiro Asai; Hiroshi Fuketa; Shota Iizuka; Kimihiko Kato; Shunsuke Shitakata; Koichi Fukuda; Takahiro Mori (VLSI Technology and Circuits, 2023)

Origin of Low-Frequency Noise in Si n-MOSFET at Cryogenic Temperatures: The Effect of Interface Quality. - Hiroshi Oka; Takumi Inaba; Shunsuke Shitakata; Kimihiko Kato; Shota Iizuka; Hidehiro Asai; Hiroshi Fuketa; Takahiro Mori (IEEE Access, 2023)

Occurrence and Mitigation of Hot Carrier Degradation in Cryogenic MOSFET Operation. - Shunsuke Shitakata; Hiroshi Oka; Kimihiko Kato; Takumi Inaba; Shota Iizuka; Hidehiro Asai; Takahiro Mori (DRC, 2024)

Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs. - Takumi Inaba; Hiroshi Oka; Hidehiro Asai; Hiroshi Fuketa; Shota Iizuka; Kimihiko Kato; Shunsuke Shitakata; Koichi Fukuda; Takahiro Mori (IEEE Access, 2024)