Characterization of Germanium Nanocrystallites Grown on SiO2 by a Conductive AFM Probe Technique. - Katsunori Makihara; Yoshihiro Okamoto; Hideki Murakami; Seiichiro Higashi; Seiichi Miyazaki (IEICE Trans. Electron., 2005)

Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked Gate. - Hideki Murakami; Yoshikazu Moriwaki; Masafumi Fujitake; Daisuke Azuma; Seiichiro Higashi; Seiichi Miyazaki (IEICE Trans. Electron., 2005)

Electrical Characterization of Aluminum-Oxynitride Stacked Gate Dielectrics Prepared by a Layer-by-Layer Process of Chemical Vapor Deposition and Rapid Thermal Nitridation. - Hideki Murakami; Wataru Mizubayashi; Hirokazu Yokoi; Atsushi Suyama; Seiichi Miyazaki (IEICE Trans. Electron., 2005)

Charging and Discharging Characteristics of Stacked Floating Gates of Silicon Quantum Dots. - Taku Shibaguchi; Mitsuhisa Ikeda; Hideki Murakami; Seiichi Miyazaki (IEICE Trans. Electron., 2005)

Evaluation of Dielectric Reliability of Ultrathin HfSiOxNy in Metal-Gate Capacitors. - Yanli Pei; Hideki Murakami; Seiichiro Higashi; Seiichi Miyazaki; Seiji Inumiya; Yasuo Nara (IEICE Trans. Electron., 2007)

Quantitative differences in intervertebral disc-matrix composition with age-related degeneration. - Hideki Murakami; Tim S. Yoon; Emad S. Attallah-Wasif; Chaiwat Kraiwattanapong; Ichiro Kikkawa; William C. Hutton (Medical Biol. Eng. Comput., 2010)

Characterization of Mg Diffusion into HfO2/SiO2/Si(100) Stacked Structures and Its Impact on Detect State Densities. - Akio Ohta; Daisuke Kanme; Hideki Murakami; Seiichiro Higashi; Seiichi Miyazaki (IEICE Trans. Electron., 2011)

Impact of Annealing Ambience on Resistive Switching in Pt/TiO2/Pt Structure. - Guobin Wei; Yuta Goto; Akio Ohta; Katsunori Makihara; Hideki Murakami; Seiichiro Higashi; Seiichi Miyazaki (IEICE Trans. Electron., 2011)

Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering. - Akio Ohta; Yuta Goto; Shingo Nishigaki; Guobin Wei; Hideki Murakami; Seiichiro Higashi; Seiichi Miyazaki (IEICE Trans. Electron., 2012)

Control of Interfacial Reaction of HfO2/Ge Structure by Insertion of Ta Oxide Layer. - Kuniaki Hashimoto; Akio Ohta; Hideki Murakami; Seiichiro Higashi; Seiichi Miyazaki (IEICE Trans. Electron., 2013)

Evaluation of Chemical Composition and Bonding Features of Pt/SiOx/Pt MIM Diodes and Its Impact on Resistance Switching Behavior. - Akio Ohta; Katsunori Makihara; Mitsuhisa Ikeda; Hideki Murakami; Seiichiro Higashi; Seiichi Miyazaki (IEICE Trans. Electron., 2013)

Development of In-situ Monitoring System for Crop Growth Observation. - Hideki Murakami; Yoshiki Tanaka; Jun-ichi Yamashita; Rikako Takeshita; Yasunori Sakane; Takumi Okamoto; Tetsushi Koide (ISDCS, 2019)