ULSI Interconnect Length Distribution Model Considering Core Utilization. - Hidenari Nakashima; Junpei Inoue; Kenichi Okada 001; Kazuya Masu (DATE, 2004)

Wire Length Distribution Model Considering Core Utilization for System on Chip. - Takanori Kyogoku; Junpei Inoue; Hidenari Nakashima; Takumi Uezono; Kenichi Okada 001; Kazuya Masu (ISVLSI, 2005)

Wire Length Distribution Model for System LSI. - Takanori Kyogoku; Junpei Inoue; Hidenari Nakashima; Takumi Uezono; Kenichi Okada 001; Kazuya Masu (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2005)

Circuit Performance Prediction Considering Core Utilization with Interconnect Length Distribution Model. - Hidenari Nakashima; Junpei Inoue; Kenichi Okada 001; Kazuya Masu (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2005)

Evaluation of X Architecture Using Interconnect Length Distribution. - Hidenari Nakashima; Naohiro Takagi; Junpei Inoue; Kenichi Okada 001; Kazuya Masu (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2005)

Fast Methods to Estimate Clock Jitter due to Power Supply Noise. - Koutaro Hachiya; Takayuki Ohshima; Hidenari Nakashima; Masaaki Soda; Satoshi Goto (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2007)

Proposal of Metrics for SSTA Accuracy Evaluation. - Hiroyuki Kobayashi; Nobuto Ono; Takashi Sato 001; Jiro Iwai; Hidenari Nakashima; Takaaki Okumura; Masanori Hashimoto (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2007)

Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations. - Takaaki Okumura; Atsushi Kurokawa; Hiroo Masuda; Toshiki Kanamoto; Masanori Hashimoto; Hiroshi Takafuji; Hidenari Nakashima; Nobuto Ono; Tsuyoshi Sakata; Takashi Sato 001 (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2009)

An Approach for Reducing Leakage Current Variation due to Manufacturing Variability. - Tsuyoshi Sakata; Takaaki Okumura; Atsushi Kurokawa; Hidenari Nakashima; Hiroo Masuda; Takashi Sato 001; Masanori Hashimoto; Koutaro Hachiya; Katsuhiro Furukawa; Masakazu Tanaka; Hiroshi Takafuji; Toshiki Kanamoto (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2009)

Impact of Self-Heating in Wire Interconnection on Timing. - Toshiki Kanamoto; Takaaki Okumura; Katsuhiro Furukawa; Hiroshi Takafuji; Atsushi Kurokawa; Koutaro Hachiya; Tsuyoshi Sakata; Masakazu Tanaka; Hidenari Nakashima; Hiroo Masuda; Takashi Sato 001; Masanori Hashimoto (IEICE Trans. Electron., 2010)