An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production. - Takeshi Mizushima; Kazuki Shirahata; Tasuku Fujibe; Hidenobu Matsumura; Daisuke Watanabe; Hiroyuki Mineo; Shin Masuda (ATS, 2016)

An Optical Interconnection Test Method Applicable to 100-Gb/s Transceivers Using an ATE Based Hardware. - Kazuki Shirahata; Takeshi Mizushima; Tasuku Fujibe; Hidenobu Matsumura; Tomoyuki Itakura; Masahiro Ishida; Daisuke Watanabe; Shin Masuda (ATS, 2016)

An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability. - Tasuku Fujibe; Kazuki Shirahata; Takeshi Mizushima; Hidenobu Matsumura; Daisuke Watanabe; Hiroyuki Mineo; Shin Masuda (ETS, 2016)