Reliability of polycrystalline silicon thin film resistors. - M. Nakabayashi; Hidenori Ohyama; Eddy Simoen; M. Ikegami; Cor Claeys; K. Kobayashi; M. Yoneoka; K. Miyahara (Microelectron. Reliab., 2001)

Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. - Hidenori Ohyama; M. Nakabayashi; Eddy Simoen; Cor Claeys; T. Tanaka; T. Hirao; S. Onada; K. Kobayashi (Microelectron. Reliab., 2001)

Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. - Hidenori Ohyama; Eddy Simoen; S. Kuroda; Cor Claeys; Y. Takami; T. Hakata; K. Kobayashi; M. Nakabayashi; Hiromi Sunaga (Microelectron. Reliab., 2001)

Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation. - Kiyoteru Hayama; Kenichiro Takakura; Hidenori Ohyama; Abdelkarim Mercha; Eddy Simoen; Cor Claeys; Joan Marc Rafí; Michael Kokkoris (Microelectron. Reliab., 2004)

Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. - Kiyoteru Hayama; Kenichiro Takakura; Hidenori Ohyama; S. Kuboyama; S. Matsuda; Joan Marc Rafí; Abdelkarim Mercha; Eddy Simoen; Cor Claeys (Microelectron. Reliab., 2005)

Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. - Kiyoteru Hayama; Kenichiro Takakura; K. Shigaki; Hidenori Ohyama; Joan Marc Rafí; Abdelkarim Mercha; Eddy Simoen; Cor Claeys (Microelectron. Reliab., 2006)

Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs. - Joan Marc Rafí; Eddy Simoen; Kiyoteru Hayama; Abdelkarim Mercha; Francesca Campabadal; Hidenori Ohyama; Cor Claeys (Microelectron. Reliab., 2006)