Novel Optical Probing System with Submicron Spatial Resolution for Internal Diagnosis of VLSI Circuits. - Kazuyuki Ozaki; Hidenori Sekiguchi; Shinichi Wakana; Yoshiro Goto; Yasutoshi Umehara; Jun Matsumoto (ITC, 1996)

Novel Optical Probing System for Quarter-micron VLSI Circuits. - Kazuyuki Ozaki; Hidenori Sekiguchi; Shinichi Wakana; Yoshiro Goto; Yasutoshi Umehara; Jun Matsumoto (Asian Test Symposium, 1997)

Development of Testbed AUV for Formation Control and its Fundamental Experiment in Actual Sea Model Basin. - Akihiro Okamoto; Motonobu Imasato; Shunka C. Hirao; Hidenori Sekiguchi; Takahiro Seta; Masahiko Sasano; Toshifumi Fujiwara (J. Robotics Mechatronics, 2021)