Automatic test generation for large digital circuits. - Akihiko Yamada; Nobuo Wakatsuki; Hideo Shibano; Osamu Itoh; Kyoji Tomita; Shigehiro Funatsu (DAC, 1977)

A High Level Test Pattern Generation Algorithm. - Masato Kawai; Hideo Shibano; Shigehiro Funatsu; Shunichi Kato; T. Kurobe; K. Ookawa; Tohru Sasaki (ITC, 1983)