Real Chip Performance Evaluation on Through Chip Interface IP for Renesas SOTB 65nm Process. - Hideto Kayashima; Takuya Kojima; Hayate Okuhara; Tsunaaki Shidei; Hideharu Amano (CANDAR Workshops, 2019)

TCI Tester: Tester for Through Chip Interface. - Hideto Kayashima; Hideharu Amano (ASP-DAC, 2021)

Analysis of Resistance Distribution and Voltage Drop in Chips with Inductive Coupling Wireless Communication Interface. - Hideto Kayashima; Hideharu Amano (CANDAR (Workshops), 2021)