An accurate modeling method utilizing application-specific statistical information and its application to SRAM yield estimation. - Hidetoshi Matsuoka; Hiroshi Ikeda; Hiroyuki Higuchi; Yoshinori Tomita (ISQED, 2010)

Mapping Constrained Slot-Placement Problems to Ising Models and its Evaluations by an Ising Machine. - Sho Kanamaru; Kazushi Kawamura; Shu Tanaka; Yoshinori Tomita; Hidetoshi Matsuoka; Kaoru Kawamura; Nozomu Togawa (ICCE-Berlin, 2019)