Sampling Jitter and Finite Aperture Time Effects in Wideband Data Acquisition Systems. - Haruo Kobayashi 001; Kensuke Kobayashi; Masanao Morimura; Yoshitaka Onaya; Yuuich Takahashi; Kouhei Enomoto; Hideyuki Kogure (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2002)