Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs. - Himanshu Diwakar; Karansingh Thakor; Souvik Mahapatra (IRPS, 2022)

Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories. - Karansingh Thakor; Nikhil Rangarajan; Himanshu Diwakar; Rashmi Saikia; Tarun Samadder; Souvik Mahapatra; Shyam Raghunathan; Yingda Dong (IMW, 2024)