Impact of strain on the design of low-power high-speed circuits. - Hiran Ramakrishnan; Koushik Maharatna; Sanatan Chattopadhyay; Alexandre Yakovlev (ISCAS, 2007)

The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk. - Basel Halak; Santosh Shedabale; Hiran Ramakrishnan; Alexandre Yakovlev; Gordon Russell 002 (SLIP, 2008)

Statistical modelling of the variation in advanced process technologies using a multi-level partitioned response. - Santosh Shedabale; Hiran Ramakrishnan; Gordon Russell 002; Alexandre Yakovlev; Sanatan Chattopadhyay (IET Circuits Devices Syst., 2008)