Characterization of Local Electronic Transport through Ultrathin Au/Highly-Dense Si Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy. - Daichi Takeuchi; Katsunori Makihara; Mitsuhisa Ikeda; Seiichi Miyazaki; Hirokazu Kaki; Tsukasa Hayashi (IEICE Trans. Electron., 2013)

High-Sensitive Detection of Electronic Emission through Si-Nanocrystals/Si-Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy. - Daichi Takeuchi; Katsunori Makihara; Mitsuhisa Ikeda; Seiichi Miyazaki; Hirokazu Kaki; Tsukasa Hayashi (IEICE Trans. Electron., 2014)