A non-scan DFT method at register-transfer level to achieve complete fault efficiency. - Satoshi Ohtake; Hiroki Wada; Toshimitsu Masuzawa; Hideo Fujiwara (ASP-DAC, 2000)

Single-control testability of RTL data paths for BIST. - Toshimitsu Masuzawa; Minoru Izutsu; Hiroki Wada; Hideo Fujiwara (Asian Test Symposium, 2000)

Design for Strong Testability of RTL Data Paths to Provide Complete Fault Efficiency. - Hiroki Wada; Toshimitsu Masuzawa; Kewal K. Saluja; Hideo Fujiwara (VLSI Design, 2000)

A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. - Satoshi Ohtake; Shintaro Nagai; Hiroki Wada; Hideo Fujiwara (ASP-DAC, 2001)

BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths. - Ken-ichi Yamaguchi; Hiroki Wada; Toshimitsu Masuzawa; Hideo Fujiwara (Asian Test Symposium, 2001)

Complex Bandpass DeltaSigmaAD Modulator Architecture without I, Q-Path Crossing Layout. - Hao San; Akira Hayakawa; Yoshitaka Jingu; Hiroki Wada; Hiroyuki Hagiwara; Kazuyuki Kobayashi; Haruo Kobayashi 001; Tatsuji Matsuura; Kouichi Yahagi; Junya Kudoh; Hideo Nakane; Masao Hotta; et al. (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2006)

A 2.8-V Multibit Complex Bandpass Delta-Sigma-AD Modulator in 0.18µm CMOS. - Hao San; Yoshitaka Jingu; Hiroki Wada; Hiroyuki Hagiwara; Akira Hayakawa; Haruo Kobayashi 001; Masao Hotta (ASP-DAC, 2007)

A Second-Order Multibit Complex Bandpass DeltaSigmaAD Modulator with I, Q Dynamic Matching and DWA Algorithm. - Hao San; Yoshitaka Jingu; Hiroki Wada; Hiroyuki Hagiwara; Akira Hayakawa; Haruo Kobayashi 001; Tatsuji Matsuura; Kouichi Yahagi; Junya Kudoh; Hideo Nakane; Masao Hotta; Toshiro Tsukada; et al. (IEICE Trans. Electron., 2007)

Observer-Based Robust Stabilizing Controllers Based on the Trajectory for Polytopic Uncertain Systems. - Hiroki Wada; Hidetoshi Oya; Kojiro Hagino; Yasumitsu Ebinuma (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010)

Quantization of Blackjack: Quantum Basic Strategy and Advantage. - Yushi Mura; Hiroki Wada (CoRR, 2020)

Evaluation of the Response Characteristics of On-Chip Gel Actuators for Various Single Cell Manipulations. - Hiroki Wada; Yuha Koike; Yoshiyuki Yokoyama; Takeshi Hayakawa (IEEE Robotics Autom. Lett., 2020)

Lift-off Process of On-chip Micro-Gel Actuator for Cell Manipulations. - Kyoka Nakano; Hiroki Wada; Yoshiyuki Yokoyama; Takeshi Hayakawa (MHS, 2022)