Effects of Multi-Product, Small-Sized Production of LSIs Packaged in Various Packages on the Final Test Process Efficiency and Cost. - Hiromu Fujioka; Koji Nakamae; Akio Higashi (ITC, 1996)

How ATE Planning Affects LSI Manufacturing Cost. - Koji Nakamae; Homare Sakamoto; Hiromu Fujioka (IEEE Des. Test Comput., 1996)

Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (ASP-DAC, 1997)

Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data. - Katsuyoshi Miura; Kohei Nakata; Koji Nakamae; Hiromu Fujioka (Asian Test Symposium, 1997)

Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (J. Electron. Test., 1997)

Knowledge-based circuit recognition from standard-cell design CMOS VLSI optical microscope images. - Koji Nakamae; Shinji Yokoyama; Atsushi Onishi; Hiromu Fujioka (Syst. Comput. Jpn., 1998)

Intelligent EB Test System for Automatic VLSI Fault Tracing. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (Asian Test Symposium, 1999)

EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. - Koji Nakamae; Takashi Ishimura; Hiromu Fujioka (Syst. Comput. Jpn., 2000)

Development of an EB/FIB Integrated Test System. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (Microelectron. Reliab., 2001)

CAD navigation system, for backside waveform probing of CMOS devices. - Katsuyoshi Miura; Koji Nakamae; Hiromu Fujioka (Microelectron. Reliab., 2002)

Cost Optimum Embedded DRAM Design by Yield Analysis. - Youhei Zenda; Koji Nakamae; Hiromu Fujioka (MTDT, 2003)

A low energy FIB processing, repair, and test system. - Katsuyoshi Miura; Tomoyuki Kobatake; Koji Nakamae; Hiromu Fujioka (Microelectron. Reliab., 2003)

Image deblurring by the combined use of a super-resolution technique and inverse filtering. - Yasuyuki Yamada; Koji Nakamae; Hiromu Fujioka (Computational Imaging, 2006)

Computer-assisted lesion detection system for stomach screening using stomach shape and appearance models. - Yoshihiro Midoh; M. Nakamura; M. Takashima; Koji Nakamae; Hiromu Fujioka (Computer-Aided Diagnosis, 2007)

Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection. - Koji Nakamae; Masaki Chikahisa; Hiromu Fujioka (Image Vis. Comput., 2007)