Electron Beam Tester Integrated into a VLSI Tester. - Hironobu Niijima; Yasuo Tokunaga; Shouichi Koshizuka; Kazuo Yakuwa; Péter Fazekas; Mathias Sturm; Hans-Peter Feuerbaum (ITC, 1988)

New approach to integrate LSI design databases with e-beam tester. - Arthur Hu; Hironobu Niijima (ITC, 1990)

CAD-Driven High-Precision E-Beam Positioning. - Kent Kwang; Hsin Wang; Arthur Hu; Mitsuyuki Asaki; Hironobu Niijima (ITC, 1993)

Scan Design Oriented Test Technique for VLSI's Using ATE. - Yasuji Oyama; Toshinobu Kanai; Hironobu Niijima (ITC, 1996)