Diagnostic test generation for transition faults using a stuck-at ATPG tool. - Yoshinobu Higami; Yosuke Kurose; Satoshi Ohno; Hironori Yamaoka; Hiroshi Takahashi; Yoshihiro Shimizu; Takashi Aikyo; Yuzo Takamatsu (ITC, 2009)

Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool. - Yoshinobu Higami; Satoshi Ohno; Hironori Yamaoka; Hiroshi Takahashi; Yoshihiro Shimizu; Takashi Aikyo (IEICE Trans. Inf. Syst., 2012)